{
  "id": "embedded/nvm-ecc-uncorrectable-error",
  "signature": "NVM: ECC uncorrectable error at address 0x08010000, data corruption detected",
  "signature_zh": "NVM：地址0x08010000处发生不可纠正的ECC错误，检测到数据损坏",
  "regex": "NVM: ECC uncorrectable error at address 0x[0-9A-F]+",
  "domain": "embedded",
  "category": "data_error",
  "subcategory": null,
  "root_cause": "Flash memory cell has experienced multiple bit flips exceeding ECC correction capability (SEC-DED), indicating permanent hardware degradation or radiation-induced single event upset.",
  "root_cause_type": "generic",
  "root_cause_zh": "闪存单元发生多次位翻转，超出ECC纠错能力（SEC-DED），表明永久性硬件退化或辐射引起的单粒子翻转。",
  "versions": [
    {
      "version": "STM32Cube_FW_G4 v1.5.0",
      "introduced": null,
      "deprecated": null,
      "removed": null,
      "behavior_change": null,
      "status": "active"
    },
    {
      "version": "ARM GCC v13.2.1",
      "introduced": null,
      "deprecated": null,
      "removed": null,
      "behavior_change": null,
      "status": "active"
    },
    {
      "version": "HAL NVM driver v1.0.0",
      "introduced": null,
      "deprecated": null,
      "removed": null,
      "behavior_change": null,
      "status": "active"
    }
  ],
  "os_specific": {},
  "dead_ends": [
    {
      "action": "Re-flash the entire firmware to overwrite corrupted data",
      "why_fails": "Re-flashing writes new data but does not repair the underlying bad flash cell; ECC error will recur at same address.",
      "fail_rate": 0.9,
      "condition": "",
      "sources": []
    },
    {
      "action": "Disable ECC checking in flash controller",
      "why_fails": "Disabling ECC allows silent data corruption to propagate, leading to undefined behavior and potential system crashes.",
      "fail_rate": 0.95,
      "condition": "",
      "sources": []
    }
  ],
  "workarounds": [
    {
      "action": "Map out the bad flash sector: use flash controller to mark sector as bad in a bad block table, then relocate application data to a spare sector. Example: HAL_FLASHEx_Erase() the sector and store its address in a dedicated bad block region.",
      "success_rate": 0.8,
      "how": "Map out the bad flash sector: use flash controller to mark sector as bad in a bad block table, then relocate application data to a spare sector. Example: HAL_FLASHEx_Erase() the sector and store its address in a dedicated bad block region.",
      "condition": "",
      "sources": []
    },
    {
      "action": "Implement software ECC using Reed-Solomon codes on critical data, and retry reads on ECC error with data reconstruction from redundant copies stored in separate sectors.",
      "success_rate": 0.75,
      "how": "Implement software ECC using Reed-Solomon codes on critical data, and retry reads on ECC error with data reconstruction from redundant copies stored in separate sectors.",
      "condition": "",
      "sources": []
    }
  ],
  "workarounds_zh": [
    "映射出坏闪存扇区：使用闪存控制器将扇区标记为坏块表中的坏块，然后将应用程序数据重定位到备用扇区。示例：HAL_FLASHEx_Erase()擦除该扇区并将其地址存储在专用坏块区域中。",
    "对关键数据使用Reed-Solomon码实现软件ECC，并在ECC错误时重试读取，从存储在单独扇区中的冗余副本重建数据。"
  ],
  "transition_graph": {
    "leads_to": [],
    "preceded_by": [],
    "frequently_confused_with": []
  },
  "official_doc_url": "https://www.st.com/resource/en/application_note/an5340-ecc-management-on-stm32-mcus.pdf",
  "official_doc_section": null,
  "error_code": null,
  "verification_tier": "ai_generated",
  "confidence": 0.88,
  "fix_success_rate": 0.78,
  "resolvable": "partial",
  "first_seen": "2024-06-01",
  "last_confirmed": "2024-06-01",
  "last_updated": "2024-06-01",
  "evidence_count": 1,
  "tags": [],
  "locale": "en",
  "aliases": []
}